Conveyor belt plays an important role in the photovoltaic industry. From the cutting of silicon ingot to the assembly of power generation board, the conveyor belt is indispensable. Donubelt new elastic conveyor belt, with soft material, high friction, anti-static and other characteristics, suitable for higher transmission speed. The surface is made of special fluororubber material, with stable chemical properties and no imprint when contacting with silicon wafer. Donubelt new elastic conveyor belt is widely used in silicon wafer production process: laser dicing machine, double track dicing machine, velvet loading and unloading machine, automatic etching machine, screen printing machine, silicon wafer cleaning machine, sinamaia all-in-one machine, laminating machine, silicon wafer sorting machine, diffusion quartz boat loading and unloading machine, automatic basket changing machine, silicon wafer counting machine, graphite boat loading and unloading machine, battery series welding machine and other photovoltaic equipment.

硅片是太陽能電池片的載體，硅片質量的好壞直接決定了太陽能電池片轉換效率的高低，因此需要對來料硅片進行檢測。該工序主要用來對硅片的一些技術參數(shù)進行在線測量，這些參數(shù)主要包括硅片表面不平整度、少子壽命、電阻率、P/N型和微裂紋等。該組設備分自動上下料、硅片傳輸、系統(tǒng)整合部分和四個檢測模塊。其中，光伏硅片檢測儀對硅片表面不平整度進行檢測,同時檢測硅片的尺寸和對角線等外觀參數(shù)。

Silicon wafer is the carrier of solar cells. The quality of silicon wafer directly determines the conversion efficiency of solar cells, so it is necessary to detect the incoming silicon wafer. This process is mainly used for on-line measurement of some technical parameters of silicon wafer, including surface roughness, minority carrier lifetime, resistivity, P / N mode and microcrack. The equipment consists of automatic loading and unloading, wafer transmission, system integration and four detection modules. Among them, the photovoltaic wafer detector detects the surface roughness of the silicon wafer, and detects the size and diagonal of the silicon wafer.

微裂紋檢測模塊用來檢測硅片的內(nèi)部微裂紋;另外還有兩個檢測模組，其中一個在線測試模組主要測試硅片體電阻率和硅片類型，另一個模塊用于檢測硅片的少子壽命。在進行少子壽命和電阻率檢測之前，需要先對硅片的對角線、微裂紋進行檢測，并自動剔除損硅片。硅片檢測設備能夠自動裝片和卸片，并且能夠將不合格品放到固置，從而提高檢測精度和效率。

The microcrack detection module is used to detect the internal microcracks of silicon wafer; In addition, there are two test modules, one is used to test the bulk resistivity and type of silicon wafer, and the other is used to test the minority carrier lifetime of silicon wafer. Before minority carrier lifetime and resistivity detection, it is necessary to detect the diagonal and microcrack of silicon wafer, and remove the damaged silicon wafer automatically. Wafer testing equipment can automatically load and unload wafers, and can put unqualified products into fixed position, so as to improve the detection accuracy and efficiency.

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